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PIE® B2B Customer Feedback and Comments

 


 

 


 

PIE®Chime for Microscope Autofocussing

– demonstrated the ability to meet every requirement asked

(Leading Scientific Instrumentation, Microscope Automation and Optical Microscopy Company)

 


 

 


 

PIE® for Contact Lens Centre Thickness Measurement

– compared to Bristol Instruments, what is attractive about the PIE® non-contact gauge is that there are no moving parts, which unfortunately tend to need a lot of maintenance

(Leading Soft Contact Lens Manufacturer)

 


 

 

 


 

PIE® WaveLine for 400nm-710nm Tunable Laser Accuracy

– delivers high accuracy across the range in a single instrument

(Leading Laser Manufacturing Company)

 


 

 

 


 

PIE®X for Medical System Application

Prism Award Finalist 2014

– monitors both 532nm green and 1064nm IR wavelengths from a frequency-doubled 1064nm fiber laser in a single instrument

(Leading Manufacturer of Automatic Test Equipment)

 


 

 

 


 

PIE®X for SLD monitoring

– body is compact and light with convenient USB connection power supply and two input connectors

(Leading Manufacturer of Semiconductor Inspection Systems)

 


 

 

 


 

PIE® for Coherent Raman Microscopy

Pittcon Editors’ Best New Product Bronze 2013

– impressed with the ability to simultaneously handle high- and low-coherence light

(Leading Manufacturer of Fourier Transform IR, NIR and Raman Spectrometers)